Metrology Concepts, Logo

Metrology Concepts specializes in surface and wavefront measurement solutions for the ophthalmic, precision optics, scientific, laser and defense markets. Core technologies include phase shifting interferometry and Shack-Hartmann wavefront sensing. Working closely with our customers, we offer standard and custom instruments, measurement services, and workforce training.

The company was founded in 2006 following a management buy-out of Fisba Optik's US interferometer subsidiary. We've operated from the same facility in Rochester, New York since 1999.


See us at:

SPIE Optics + Photonics
8 -10 August 2017
San Diego, California
SPIE Optifab
17 -19 October 2017
Rochester, New York
Photonics West 2018
30 Jan. - 1 Feb. 2018
San Francisco, California

Call (585) 427-9155


Contact

Thank you for your interest. For questions or comments, please use the information listed here. We look forward to hearing from you soon.

Phone
(585) 427-9155
(585) 427-9026 (Fax)

Address
3459 Winton Place, #E-120
Rochester, NY 14623